| 摘要 |
<p>A calculation device (16) analyzes defective factors of a defective occurrence on the basis of representative values for manufacturing data and assay data of products gathered for each product. A display device (17), using calculations by way of statistical techniques, selects, from among a plurality of representative values that were analyzed, manufacturing data and assay data on which the representative values were based for data items extracted from analysis results, and displays the same.</p> |
