发明名称 METHOD FOR CORRECTING THE STACKING PHENOMENON APPLIED TO X-RAY SPECTRUMS ACQUIRED USING A SPECTROMETRIC SENSOR
摘要 The invention concerns a method for correcting a measured spectrum of X radiation (Spmes) t according to a number of channels Nc, each channel i corresponding to an energy range between Ei and Ei + ?Ei, including: - determining the function dti,,j (k) determining the size of the temporal deviation ?t interval separating two interactions with energy Ei and Ej, the stacking of which leads to a detected energy value Ek, - determining, from said function dti,,j(k), the probability function Pi,,j (k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Ei and Ej, - determining, from said probability function Pi,,j (k), a stack spectrum (Emp), which is the part of the measured spectrum (Spmes), that corresponds only to the stacks alone, - calculating or estimating at least a first corrected spectrum (Spcor), by the difference between the measured spectrum (Spmes) and the stack spectrum (Emp).
申请公布号 WO2011064381(A1) 申请公布日期 2011.06.03
申请号 WO2010EP68497 申请日期 2010.11.30
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;RINKEL, JEAN;BRAMBILLA, ANDREA;DINTEN, JEAN-MARC;MOUGEL, FLORENT 发明人 RINKEL, JEAN;BRAMBILLA, ANDREA;DINTEN, JEAN-MARC;MOUGEL, FLORENT
分类号 G01T1/17 主分类号 G01T1/17
代理机构 代理人
主权项
地址