发明名称 |
DEFECT REVIEW SYSTEM AND METHOD, AND PROGRAM |
摘要 |
A system is provided that realizes both reduction in coordinate error and improvement in throughput and allows observation of a micro-defect. The system includes: a function of measuring an amount of displacement between preliminarily calculated coordinates and an actual specimen position; a function of optimizing a coordinate correction formula so as to minimize the amount of displacement from the measured amount of displacement; and a function of calculating variation of displacement between the preliminarily calculated coordinates and the actual specimen position by statistical processing. When a value of coordinate variation is sufficiently small with respect to the field of view of an image for observation, which is to be a defect observation image, the system acquires only the image for observation without performing acquisition of an image for search, which is to be a defect search image.
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申请公布号 |
US2011129142(A1) |
申请公布日期 |
2011.06.02 |
申请号 |
US200913056353 |
申请日期 |
2009.07.27 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
TAKAHASHI NORITSUGU;FUKUDA MUNEYUKI;SHOJO TOMOYASU;SUZUKI NAOMASA;OBARA KENJI |
分类号 |
G06K9/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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