DEVICE FOR TESTING SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To provide a device for testing a semiconductor memory, which determines the presence of separate bits without a long use of a testor. SOLUTION: The device for testing the semiconductor memory includes: a first determination unit which determines the presence of defective memory cells of the semiconductor memory which have separate bits on predetermined bit by bit basis; memory units which store the information on the memory cells determined as defective ones at the first determination unit; a counter which stores the number of the separate bits on the bit by bit basis in the memory and counts the number for determining the presence of defective memory cells on the bit by bit basis; and a second determination unit which determines the presence of defective memory cells based on the number of the separate bits counted by the counter. COPYRIGHT: (C)2011,JPO&INPIT