发明名称 Dual Channel Trench LDMOS Transistors and BCD Process with Deep Trench Isolation
摘要 A dual channel trench LDMOS transistor includes a substrate of a first conductivity type; a semiconductor layer of a second conductivity type formed on the substrate; a first trench formed in the semiconductor layer where a trench gate is formed in an upper portion of the first trench; a body region of the first conductivity type formed in the semiconductor layer adjacent the first trench; a source region of the second conductivity type formed in the body region and adjacent the first trench; a planar gate overlying the body region; a drain region of the second conductivity type spaced apart from the body region by a drain drift region. The planar gate forms a lateral channel in the body region, and the trench gate in the first trench forms a vertical channel in the body region of the LDMOS transistor.
申请公布号 US2011127602(A1) 申请公布日期 2011.06.02
申请号 US20090629844 申请日期 2009.12.02
申请人 ALPHA AND OMEGA SEMICONDUCTOR INCORPORATED 发明人 MALLIKARJUNASWAMY SHEKAR
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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