发明名称 |
DEVICE FOR TEST OF HIGH TEMPERATURE LOAD |
摘要 |
PURPOSE: A high-temperature load test device is provided to apply additional heat without additional current supply and improve the accuracy of measurement on the heat applied to a test object. CONSTITUTION: A high-temperature load test device(100) comprises a heater(110) and a heat reflection unit(120). The heater is provided on one side of a test object and applies heat to the test object. The heat reflection unit is located on the side facing the test object around the heater and reflects the heat from the heater to the test object. The heat reflection unit calculates the calorie of the test object by measuring the entry/exit temperatures of cooling water supplied to the heat reflection unit. |
申请公布号 |
KR20110058391(A) |
申请公布日期 |
2011.06.01 |
申请号 |
KR20090115162 |
申请日期 |
2009.11.26 |
申请人 |
KOREA ATOMIC ENERGY RESEARCH INSTITUTE |
发明人 |
LEE, DONG WON;BAE, YOUNG DUG;KIM, SUK KWON;HONG, BONG GUEN |
分类号 |
G01N3/60;G01K17/00;G01N25/72 |
主分类号 |
G01N3/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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