发明名称 SLURRY COMPOSITION FOR CHEMICAL MECHANICAL POLISHING AND PREPARATION METHOD OF THE SAME
摘要 PURPOSE: A slurry composition for chemical mechanical polishing is provided to ensure high polishing rate for a silicon oxide film and to enable the application to a shallow trench isolation process for removing an initial step of a silicon oxide film. CONSTITUTION: A slurry composition for chemical mechanical polishing comprises: abrasive particles including cerium oxide particles; one or more additives selected from the group consisting of picolinic acids, propionic acids, and formic acids; and aqueous solution including water. The zeta potential of the abrasive particle surface is 20-70 mV within a range of pH 3-6.
申请公布号 KR20110057876(A) 申请公布日期 2011.06.01
申请号 KR20090114476 申请日期 2009.11.25
申请人 LG CHEM. LTD. 发明人 KIM, JONG PIL;CHO, SEUNG BEOM;SHIN, DONG MOK;NOH, JUN SEOK;HA, HYUN CHUL;CHO, JUN YEON
分类号 C09K3/14 主分类号 C09K3/14
代理机构 代理人
主权项
地址