发明名称 MANUFACTURING METHOD OF NONVOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing a variable resistance memory device is provided to prevent the deterioration of electrical/physical features due to stress in a hot temperature process. CONSTITUTION: A heating electrode(110) is formed on a semiconductor substrate(100). The heating electrode includes nitride of metal whose atomic radius is larger than titanium. A variable resistance material film(120) is formed on the heating electrode. An upper electrode(130) is formed on the variable resistance material film. A barrier film prevents a material from being spread between the upper electrode and the variable resistance material film.</p>
申请公布号 KR20110058031(A) 申请公布日期 2011.06.01
申请号 KR20090114687 申请日期 2009.11.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOUNG LIM;LEE, JIN IL;AHN, DONG HO;LEE, SI HYUNG;OH, GYU HWAN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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