DEFECT INSPECTING SYSTEM, AND DEFECT INSPECTING METHOD,申请号KR20117004448-传众专利搜索

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发明名称	DEFECT INSPECTING SYSTEM, AND DEFECT INSPECTING METHOD
摘要
申请公布号	KR20110058784(A)	申请公布日期	2011.06.01
申请号	KR20117004448	申请日期	2009.07.28
申请人	ASAHI GLASS COMPANY LTD.	发明人	KANEKO SHIZUNORI;YAKU MASASHI;KODAMA KOTARO
分类号	G01N21/89;G01N21/958	主分类号	G01N21/89
代理机构		代理人
主权项
地址

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