发明名称 Lithographic apparatus and method
摘要 <p>A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable mirror elements (33a-33e) of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable mirror elements (33a-33e) to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide the desired illumination mode, radiation beam or both, taking into account a variation in reflectivity of the individually controllable mirror elements. The method also includes patterning the radiation beam with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.</p>
申请公布号 EP2328028(A1) 申请公布日期 2011.06.01
申请号 EP20110156407 申请日期 2008.03.18
申请人 ASML NETHERLANDS BV 发明人 MULDER, HEINE;BASELMANS, JOHANNES;ENGELEN, ADRIANUS;EURLINGS, MARKUS;VAN GREEVENBROEK, HENDRIKUS;TINNEMANS, PATRICIUS;VAN DER VEEN, PAUL;ENDENDIJK, WILFRED
分类号 G03F7/20 主分类号 G03F7/20
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