发明名称 PELLICLE FOR LIQUID IMMERSION LITHOGRAPHY APPARATUS AND FORMING METHOD OF THE SAME
摘要 <p>PURPOSE: A pellicle for a liquid immersion lithography apparatus is provided to ensure high exposure light transmittance even if the value of the incident angle of a light source is increased. CONSTITUTION: A pellicle for a liquid immersion lithography apparatus is an ArF excimer laser in which a light source for exposure is 193 nm. When the incident angle on a pellicle film is 0°or more and 20°or less, light transmissivity is 99.3% or greater. The reflectivity of the pellicle for the liquid immersion lithography apparatus is 1.38-1.39 and the film thickness is 282nm - 284nm.</p>
申请公布号 KR20110057423(A) 申请公布日期 2011.06.01
申请号 KR20090113828 申请日期 2009.11.24
申请人 FST INC. 发明人 PARK, SUNG HO
分类号 G03F1/62;H01L21/027 主分类号 G03F1/62
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