发明名称 HIGH SPEED THIN FILM DEPOSITION VIA PRE-SELECTED INTERMEDIATE
摘要 <p>A method and apparatus for the unusually high rate deposition of thin film materials on a stationary or continuous substrate. The method includes delivery of a pre-selected precursor intermediate to a deposition chamber and formation of a thin film material from the intermediate. The intermediate is formed outside of the deposition chamber and includes a metastable species such as a free radical. The intermediate is pre-selected to include a metastable species conducive to the formation of a thin film material having a low defect concentration. By forming a low defect concentration material, deposition rate is decoupled from material quality and heretofore unprecedented deposition rates are achieved. In one embodiment, the pre-selected precursor intermediate is SiH3. The method further includes combining the pre-selected precursor intermediate with a carrier gas, preferably in a deactivated state, where the carrier gas directs the transport of the pre-selected precursor intermediate to a substrate for deposition of the thin film material.</p>
申请公布号 EP2327087(A2) 申请公布日期 2011.06.01
申请号 EP20090813573 申请日期 2009.09.10
申请人 OVSHINSKY INNOVATION, LLC 发明人 OVSHINSKY, STANFORD
分类号 H01L21/20;H01L31/042 主分类号 H01L21/20
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