| 摘要 |
PURPOSE: An auto probe inspection apparatus and a method for inspecting an auto probe are provided to prevent generation of flickers in an inspection pattern by applying a compensated data inspection signal to a data line of an LCD panel. CONSTITUTION: An auto probe inspection apparatus comprises an ohm value division unit(201), a data inspection signal divider(202), and an adder(203). The ohm value division unit receives an ohm value as a difference between a maximum value and a minimum value of a kick-back voltage generated from an LCD panel and outputs a kick-back compensation voltage for each gray level by dividing the ohm value by the number of gray levels. The data inspection signal divider outputs a data inspection signal for each gray level by dividing a maximum value and a minimum value of a data inspection signal by the number of the gray levels. The adder adds the data inspection signal of the same gray level to the kick-back compensation voltage. |
