APPARATUS AND METHOD FOR DETECTING INFERIORITY OF LOG LINE

摘要

PURPOSE: An LOG line defect detecting apparatus and defect detecting method are provided to recognize the cause of defect without additional analysis and the confirmation of a multiple measuring apparatus in the opening defect of the LOG line. CONSTITUTION: An LOG(Line On Glass) line(62) is formed in the non-display area of a substrate in order to transmit a gate driving signal on a gate drive IC. A transistor is formed on the substrate in order for the LOG line to connect a gate line. The LOG line is formed on a substrate. A signal line(70) applies voltage in order to detect the defect of the LOG line. The signal line is connected to a drain device of the transistor.