| 摘要 |
Method and apparatus are disclosed related to testing and testability of adaptive equalization circuitry. Where an equalization circuit is provided in an IC, a modified internal loopback provides a testing signal. A local comparator circuit with flexible connectivity offers analog signal testing analysis in conjunction with a low-cost external tester. Flexible use and connectivity of the comparator and external connection points, and block isolation circuitry make accurate, faster, and lower cost testing methods possible.
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