发明名称 |
Waveplate analyzer based on multiple tunable optical polarization rotators |
摘要 |
Systems, apparatus and methods for characterizing linear retarders using a waveplate analyzer constructed by polarization rotators. In one implementation of such an analyzer, both the retardation of the waveplate sample and the orientation of optical axis of the waveplate sample can be simultaneously measured.
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申请公布号 |
US7952711(B1) |
申请公布日期 |
2011.05.31 |
申请号 |
US20080056262 |
申请日期 |
2008.03.26 |
申请人 |
GENERAL PHOTONICS CORPORATION |
发明人 |
CHEN XIAOJUN;YAN LIANSHAN;YAO XIAOTIAN STEVE |
分类号 |
G01J4/00 |
主分类号 |
G01J4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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