发明名称 Methods of arranging mask patterns responsive to assist feature contribution to image intensity and associated apparatus
摘要 Methods and apparatus are disclosed that arrange mask patterns in response to the contribution of an assist feature to image intensity. In some methods of arranging mask patterns, a distribution of functions h(&xgr;−x) is obtained which represents the contribution of an assist feature to image intensity on a main feature. Neighboring regions of the main feature are discretized into finite regions, and the distribution of the functions h(&xgr;−x) is replaced with representative values h(x,&xgr;) of the discretized regions. A position of the assist feature is determined using polygonal regions having the same h(x,&xgr;). As described, the term x is the position of the main feature and the term &xgr; is the position of the assist.
申请公布号 US7954073(B2) 申请公布日期 2011.05.31
申请号 US20080164645 申请日期 2008.06.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK DONG-WOON
分类号 G06F17/50 主分类号 G06F17/50
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