发明名称 Flash storage device and method and system for testing the same
摘要 A flash storage device and a testing method and a testing system for the flash storage device are provided. The testing system includes a testing apparatus and the flash storage device. The flash storage device includes a controller, a flash memory module, a plurality of peripheral pins and at least one test pin. The flash storage device receives an enable signal transmitted from the testing apparatus through the test pin. Subsequently, the controller outputs a signal to the testing apparatus through each peripheral pin based to the enable signal. Finally, the testing apparatus verifies the signal outputted by each peripheral pin.
申请公布号 US7954019(B2) 申请公布日期 2011.05.31
申请号 US20090369284 申请日期 2009.02.11
申请人 PHISON ELECTRONICS CORP. 发明人 CHEN BAN-HUI;YEH CHIH-KANG
分类号 G11C29/00;G11C16/04 主分类号 G11C29/00
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