发明名称 Phase-change nonvolatile memory device using Sb-Zn alloy
摘要 Provided are a phase-change nonvolatile memory device and a manufacturing method thereof. The device includes: a substrate; and a stack structure disposed on the substrate and including a phase-change material layer. The phase-change material layer is formed of an alloy of antimony (Sb) and zinc (Zn), so that the phase-change memory device can stably operate at high speed and reduce power consumption.
申请公布号 US7952086(B2) 申请公布日期 2011.05.31
申请号 US20080122152 申请日期 2008.05.16
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YU BYOUNG GON;YOON SUNG MIN;CHOI SE YOUNG;PARK TAE JIN
分类号 H01L45/00 主分类号 H01L45/00
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