发明名称 INTEGRATED TESTING CIRCUITRY FOR HIGH-FREQUENCY RECEIVER INTEGRATED CIRCUITS
摘要 An integrated circuit comprises a receiver and an oscillator circuit. The receiver has a first input port for receiving a first oscillatory input signal, a second input port for receiving a second oscillatory input signal, and an output port for delivering an oscillatory output signal which is a function of both the first input signal and the second input signal. The oscillator circuit has a first output port for delivering a first oscillatory signal, and a second output port for delivering a second oscillatory signal. The first output port of the oscillator circuit is coupled to the HF port, and the second output port of the oscillator circuit is coupled to the LO port. The integrated circuit may be designed such that the HF port may be disconnected from the first output port of the oscillator circuit without affecting the operability of the receiver. An apparatus for testing the proper functioning of an integrated circuit as described above and a method of producing a receiver are also disclosed. The method may facilitate testing a receiver die during production. In particular it may avoid the need for feeding high-frequency signals from an external apparatus to the die.
申请公布号 US2011122936(A1) 申请公布日期 2011.05.26
申请号 US200813054358 申请日期 2008.07.17
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 DEHLINK BERNHARD;REUTER RALF
分类号 H04B17/00;H01L21/66;H04L27/00 主分类号 H04B17/00
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