Generation of Test Information for Testing a Circuit

摘要

System and method for generating test information for a physical circuit. A virtual circuit may be generated. First user input specifying one or more test conditions and/or instrument settings for the virtual circuit may be received. In response to the first user input, first test information may be generated. The first test information may be configured for use in performing one or more virtual tests on the virtual circuit. Second user input requesting that second test information be generated based on the first test information may be received. The second test information may be automatically generated based on the first test information in response to the second user input, without user input specifying the one or more test conditions and/or instrument settings. The second test information may be configured for use in performing one or more physical tests on a physical circuit corresponding to the virtual circuit.