发明名称 |
NONDESTRUCTIVE INSPECTION DEVICE EQUIPPED WITH GUIDED-WAVE SENSOR AND METHOD OF INSPECTION BY MEANS OF THE SAME DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a nondestructive inspection device using a guided wave and equipped with both a technique for maintaining the measurement performance of a guided-wave sensor and the enhanced reliability of inspection results, and a method of inspection. SOLUTION: This guided-wave inspection device for performing nondestructive inspection by using a guided wave includes: a transmitter-receiver 8 having a plurality of ultrasonic probes 1 arranged therein and transmitting/receiving signals for generating guided waves to/from a guided-wave sensor 3 that has parallel-connected ultrasonic probe groups 2a to 2h; a signal processor/analyzer 9 for processing and analyzing received signals from the guided-wave sensor 3; an input part 11 for measurement conditions and an output part 12 for measurement results; and a controller 10 for controlling the whole of this inspection device 5. This inspection device includes a sensor inspection part 7 for measuring impedance of the probe groups 2a to 2h, and a signal switcher 6 for switching the connection destinations of the probe groups 2a to 2h between the sensor inspection part 7 and the transmitter-receiver 8. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011102699(A) |
申请公布日期 |
2011.05.26 |
申请号 |
JP20090256629 |
申请日期 |
2009.11.10 |
申请人 |
HITACHI ENGINEERING & SERVICES CO LTD |
发明人 |
ENDO MASAO;NAGASHIMA YOSHIAKI;MIKI MASAHIRO;ASAMI KENICHI |
分类号 |
G01N29/04 |
主分类号 |
G01N29/04 |
代理机构 |
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