发明名称 METHOD FOR FORMING FINE PATTERN IN SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for forming a contact hole of a semiconductor device is provided to form a micro contact hole using only one mask, thereby easily forming a micro contact hole while simplifying processing processes. CONSTITUTION: A hard mask layer(114) and a photosensitive pattern(116) defining a first contact hole area are formed on a layer to be etched. A spacer(120) is formed on a sidewall of the photosensitive pattern. The photosensitive pattern is eliminated. The hard mask layer is etched by the spacer as an etching mask to form a hard mask pattern. The layer to be etched is etched by the hard mask pattern as an etching mask to form a target contact hole.</p>
申请公布号 KR20110055912(A) 申请公布日期 2011.05.26
申请号 KR20090112535 申请日期 2009.11.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, BYOUNG HOON
分类号 H01L21/32;H01L21/027 主分类号 H01L21/32
代理机构 代理人
主权项
地址