发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device including a first single crystal semiconductor film on an insulating substrate and a second single crystal semiconductor film on the first single crystal semiconductor film. <P>SOLUTION: A method for manufacturing a semiconductor device comprises the steps of: doping a first ion in a first single crystal semiconductor substrate to form a first embrittlement layer; doping a second ion in a second single crystal semiconductor substrate to form a second embrittlement layer; bonding the first single crystal semiconductor substrate and the second single crystal semiconductor substrate to each other; forming a first single crystal semiconductor film on the second single crystal semiconductor substrate by a first heat treatment; bonding an insulating substrate on the first single crystal semiconductor film; and forming the first single crystal semiconductor film and a second single crystal semiconductor film on the insulating substrate by a second heat treatment. In the method, the dose of the first ion is more than that of the second ion, and the temperature of the first heat treatment is lower than that of the second heat treatment. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011103457(A) 申请公布日期 2011.05.26
申请号 JP20100231053 申请日期 2010.10.14
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SHIMOMURA AKIHISA;OKUNO NAOKI;FURUYAMA MASAKI;JINBO YASUHIRO
分类号 H01L27/12;H01L21/02;H01L21/20;H01L21/265;H01L21/322;H01L21/336;H01L29/786 主分类号 H01L27/12
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