发明名称 LOGIC CIRCUIT AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To reduce a leakage current of a transistor so that malfunction of a logic circuit can be suppressed. <P>SOLUTION: The logic circuit includes a transistor which includes an oxide semiconductor layer having a function of a channel formation layer and in which an off current is &le;1&times;10<SP>-13</SP>A per 1 &mu;m in channel width. A first signal, a second signal, and a third signal that is a clock signal are input as input signals. A fourth signal and a fifth signal whose voltage states are set in accordance with the first to third signals which have been input are output as output signals. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011103453(A) 申请公布日期 2011.05.26
申请号 JP20100229460 申请日期 2010.10.12
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;KOYAMA JUN;TSUBUKI MASASHI;NODA KOSEI
分类号 H01L29/786 主分类号 H01L29/786
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