发明名称 CHEMICAL MECHANICAL POLISHING CONDITIONER
摘要 A chemical mechanical polishing (CMP) conditioner includes a ceramic substrate having a major surface, and an abrasive coating overlying the major surface. The major surface can include micro-protrusions arranged in a curved pattern. Alternatively, the micro-protrusions can be arranged in an irregular pattern.
申请公布号 WO2011028700(A3) 申请公布日期 2011.05.26
申请号 WO2010US47306 申请日期 2010.08.31
申请人 SAINT-GOBAIN ABRASIVES, INC.;SAINT-GOBAIN ABRASIFS;WU, JIANHUI;HALL, RICHARD W. J.;SCHULZ, ERIC M.;RAMANATH, SRINIVASAN 发明人 WU, JIANHUI;HALL, RICHARD W. J.;SCHULZ, ERIC M.;RAMANATH, SRINIVASAN
分类号 H01L21/304 主分类号 H01L21/304
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