发明名称 HIGH-K/METAL GATE TRANSISTOR
摘要 <p>A transistor includes a silicon layer with a source region and a drain region, a gate stack disposed on the silicon layer between the source region and the drain region, an L shaped gate encapsulation layer disposed on sidewalls of the gate stack, and a spacer disposed above the horizontal portion of the gate encapsulation layer and adjacent to the vertical portion of the gate encapsulation layer. The gate stack has a first layer of high dielectric constant material, a second layer comprising a metal or metal alloy, and a third layer comprising silicon or polysilicon. The gate encapsulation layer has a vertical portion covering the sidewalls of the first, second, and third layers of the gate stack and a horizontal portion covering a portion of the silicon layer that is adjacent to the gate stack.</p>
申请公布号 WO2011060972(A1) 申请公布日期 2011.05.26
申请号 WO2010EP62109 申请日期 2010.08.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED;SLEIGHT, JEFFREY;NARAYANAN, VIJAY;MO, RENEE;NATZLE, WESLEY 发明人 SLEIGHT, JEFFREY;NARAYANAN, VIJAY;MO, RENEE;NATZLE, WESLEY
分类号 H01L21/28;H01L21/336;H01L29/49;H01L29/51;H01L29/78 主分类号 H01L21/28
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