发明名称 Halbleiterbauelement
摘要 A silicone resin for sealing a semiconductor chip. A cured silicone resin, which is obtained by curing the silicone resin at a given temperature, has a percent elongation, after fracture, measured at a room temperature, not less than 4% of a penetration number at room temperature. A semiconductor device sealed with the silicone resin, when subjected to a heat cycle or a vibration test, provides resistance to cracking, forming of voids, and interfacial peeling-off. The cured silicone resin may have a penetration number not less than 10 and not more than 80 and a loss elasticity not less than 17% of the storage elasticity. A resin member made of the cured silicone resin and sealing a semiconductor chip may include a filler, such as silica or alumina, having a coefficient of linear thermal expansion lower than that of the cured silicone resin.
申请公布号 DE10160638(B4) 申请公布日期 2011.05.26
申请号 DE2001160638 申请日期 2001.12.11
申请人 MITSUBISHI DENKI K.K. 发明人 HIRAMATSU, SEIKI;YANAURA, SATOSHI;KOGA, MASUO;FUJIOKA, HIROFUMI
分类号 H01L23/043;H01L23/28;H01L23/10;H01L23/18;H01L23/24;H01L23/29;H01L25/07;H01L25/18 主分类号 H01L23/043
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