发明名称 OBJECT CHARACTERISTIC MEASUREMENT METHOD AND SYSTEM
摘要 The present invention provides a method for measuring object characteristics, wherein the method is capable of overcoming the interference induced bye the phase difference of the background with respect to the measuring system so as to measure the tiny characteristics such as the retardance or azimuth angle of an object accurately. The method is capable of obtaining two sets of light intensity images having retardance of background and the object respectively by simultaneously rotating the retarding elements and analyzer in various rotating angle combinations, and analyzing and calculating upon the polarized light intensities of the images associated with the background and the object so as to obtain actual retardance and azimuth angle of the object without the affect of the background retardance.
申请公布号 US2011122409(A1) 申请公布日期 2011.05.26
申请号 US20100713352 申请日期 2010.02.26
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 HSIEH YI-CHEN;YANG FU-SHIANG
分类号 G01N21/21 主分类号 G01N21/21
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