发明名称 Method Of Forming Silicon-Containing Insulation Film Having Low Dielectric Constant and High Mechanical Strength
摘要 A silicon-containing insulation film having high mechanical strength is formed on a semiconductor substrate by (a) introducing a reaction gas comprising (i) a source gas comprising a silicon-containing hydrocarbon compound containing cross-linkable groups, (ii) a cross-linking gas, and (iii) an inert gas, into a reaction chamber where a substrate is placed; (b) applying radio-frequency power to create a plasma reaction space inside the reaction chamber; and (c) controlling a flow of the reaction gas and an intensity of the radio-frequency power. <IMAGE>
申请公布号 KR101037392(B1) 申请公布日期 2011.05.26
申请号 KR20030013276 申请日期 2003.03.04
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分类号 H01L21/205 主分类号 H01L21/205
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