发明名称 LASER SCANNING MICROSCOPE
摘要 A proposition of the present invention is to provide a laser scanning microscope capable of enhancing the degree of freedom of observation while keeping its structure simple. Accordingly, a laser scanning microscope (100) of the present invention includes a light source part (1), a spectroscopic unit (9) guiding light from the light source part (1) to a specimen plane (16) and guiding the light from the specimen plane (16) to a detector, light path switching units (10 and 13) switching a light path between the spectroscopic unit (9) and the specimen plane (16) to one among a plurality of light paths (R1 and R2) with different routes, and a plurality of light deflecting units (11 and 12) each disposed in each of the plurality of light paths.
申请公布号 EP2042905(A4) 申请公布日期 2011.05.25
申请号 EP20070790183 申请日期 2007.06.20
申请人 NIKON CORPORATION 发明人 OKUGAWA, HISASHI
分类号 G02B21/00;G01N21/64;G02B21/32;G02B26/08 主分类号 G02B21/00
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