发明名称 RADIATION SOURCE, LITHOGRAPHIC APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 A spectral purity filter is configured to transmit extreme ultraviolet (EUV) radiation and deflect or absorb non-EUV secondary radiation. In an embodiment, the spectral purity filter includes a body of material highly transmissive of EUV radiation and a layer of material highly reflective of non-EUV secondary radiation located on a radiation incident side of the body. In an embodiment, the spectral purity filter includes a body of material highly transmissive of EUV radiation and a layer of high emissivity material on an end of the body.
申请公布号 KR20110055621(A) 申请公布日期 2011.05.25
申请号 KR20117005757 申请日期 2009.07.29
申请人 ASML NETHERLANDS B.V. 发明人 YAKUNIN ANDREY MIKHAILOVICH;BANINE VADIM YEVGENYEVICH;MOORS JOHANNES HUBERTUS JOSEPHINA;SJAMENOK LEONID AIZIKOVITCH
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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