发明名称 Method for detecting deviation in crystallographic orientation in a metal structure
摘要 A method of detecting a deviation angle in a single-crystal metal structure is disclosed. The single-crystal metal structure has a crystallographic orientation, a length, a first side, a second side, and a first axis extending through the structure. The method comprises determining the length of the single-crystal metal structure along the first axis, transmitting a signal through the single-crystal metal structure from the first side, the signal oriented to propagate along the first axis, receiving the signal, determining a time-of-flight for the signal to traverse the length from the first side to the second side, determining a speed of the signal based on the time-of-flight and the length, and comparing the speed of the signal to a reference speed to detect the deviation angle.
申请公布号 US7946177(B2) 申请公布日期 2011.05.24
申请号 US20080276969 申请日期 2008.11.24
申请人 HONEYWELL INTERNATIONAL INC. 发明人 KINGTON HARRY LESTER;SINGH SURENDRA;MORRIS MARK C.
分类号 G01H5/00 主分类号 G01H5/00
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