发明名称 |
METHOD OF FORMING OHMIC CONTACT ELECTRODE USING DIELECTRIC THIN FILM FOR IMPROVING MORPHOLOGY OF OHMIC CONTACT ELECTRODE AND RESISTANCE |
摘要 |
PURPOSE: A method for forming an ohmic contact electrode using a dielectric thin film is provided to improve the morphology of an ohmic contact electrode surface by forming the dielectric thin film on an ohmic contact electrode. CONSTITUTION: An ohmic contact electrode(230) is formed on a semiconductor layer(220). A dielectric thin film(240) is formed on the ohmic contact electrode to prevent the morphology of the ohmic contact electrode surface from being curved in a thermal process. A contact resistance between a semiconductor layer and an ohmic contact electrode is improved by thermally processing a stack structure. A semiconductor layer, an ohmic contact electrode and a dielectric thin film are stacked on the stack structure. The dielectric thin film is removed.
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申请公布号 |
KR20110053732(A) |
申请公布日期 |
2011.05.24 |
申请号 |
KR20090110393 |
申请日期 |
2009.11.16 |
申请人 |
KOREA ADVANCED NANO FAB CENTER |
发明人 |
HEO, JONG GON;SUNG, HO KUN;PARK, WON KYU |
分类号 |
H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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