发明名称 METHOD OF FORMING OHMIC CONTACT ELECTRODE USING DIELECTRIC THIN FILM FOR IMPROVING MORPHOLOGY OF OHMIC CONTACT ELECTRODE AND RESISTANCE
摘要 PURPOSE: A method for forming an ohmic contact electrode using a dielectric thin film is provided to improve the morphology of an ohmic contact electrode surface by forming the dielectric thin film on an ohmic contact electrode. CONSTITUTION: An ohmic contact electrode(230) is formed on a semiconductor layer(220). A dielectric thin film(240) is formed on the ohmic contact electrode to prevent the morphology of the ohmic contact electrode surface from being curved in a thermal process. A contact resistance between a semiconductor layer and an ohmic contact electrode is improved by thermally processing a stack structure. A semiconductor layer, an ohmic contact electrode and a dielectric thin film are stacked on the stack structure. The dielectric thin film is removed.
申请公布号 KR20110053732(A) 申请公布日期 2011.05.24
申请号 KR20090110393 申请日期 2009.11.16
申请人 KOREA ADVANCED NANO FAB CENTER 发明人 HEO, JONG GON;SUNG, HO KUN;PARK, WON KYU
分类号 H01L21/283 主分类号 H01L21/283
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