发明名称 Control apparatus and method for controlling measuring devices to test electronic apparatuses
摘要 An electronic apparatus testing method is provided. The method includes the step of: reading a product ID of the electronic apparatus when the electronic apparatus is connected to a control apparatus; determining the device type ID from the product ID, wherein the product ID comprises basic information of the electronic apparatus, determining the script files of the functions of the electronic apparatus in the testing table according to the device type ID; obtaining the script files from a data storage and running the script files to test functions of the electronic apparatuses, sending a control instruction to the corresponding measuring device of the function to control the measuring device test the function during the process of running the script files; and displaying test results through a display of the control apparatus.
申请公布号 US7949899(B2) 申请公布日期 2011.05.24
申请号 US20080174635 申请日期 2008.07.17
申请人 HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHEN PENG;ZHAO YAO;CHENG HUA-DONG;LIAN WEN-CHUAN;WANG HAN-CHE;HSIEH KUAN-HONG
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
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