发明名称 MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to reduce a void at a space between metal lines by reducing an aspect ratio of the space between metal lines. CONSTITUTION: A contact plug(22) is formed on a substrate with a semiconductor device and a photoresist layer is formed. A photoresist pattern open around the contact plug is formed by patterning the photoresist layer. A trench is formed by lightly etching the part around the contact plug using the photoresist pattern as an etching mask. An insulation layer is deposited after a metal wiring(24) process on the substrate with a trench.
申请公布号 KR20110053727(A) 申请公布日期 2011.05.24
申请号 KR20090110387 申请日期 2009.11.16
申请人 DONGBU HITEK CO., LTD. 发明人 SONG, IL HO
分类号 H01L21/768;H01L21/3205 主分类号 H01L21/768
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