发明名称 Lithography masks and methods of manufacture thereof
摘要 Lithography masks and methods of manufacture thereof are disclosed. A preferred embodiment comprises a method of manufacturing a lithography mask. The method includes providing a substrate, forming a first pattern in a first region of the substrate, and forming a second pattern in a second region of the substrate, the second pattern comprising patterns for features oriented differently than patterns for features of the first pattern. The method includes affecting a polarization rotation of light differently in the first region than in the second region of the substrate.
申请公布号 US7947431(B2) 申请公布日期 2011.05.24
申请号 US20100847641 申请日期 2010.07.30
申请人 INFINEON TECHNOLOGIES AG 发明人 SARMA CHANDRASEKHAR;GUTMANN ALOIS;HAFFNER HENNING;MAROKKEY SAJAN;MAYNOLLO JOSEF
分类号 H01L21/00;G03B27/42;G03F1/00 主分类号 H01L21/00
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