| 摘要 |
An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—Kα line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—Kα line and Cr—Kα line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
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