发明名称 COMPOSITIONS AND PROCESSES FOR IMMERSION LITHOGRAPHY
摘要 PURPOSE: An immersion lithography composition and an immersion lithography method are provided to suppress the movement of photoresist materials of a resist layer to immersed solutions by moving materials immiscible with resist resin to the upper side of a photoresist coating layer coated with photoresist composition. CONSTITUTION: Photoresist composition useful for immersion lithography is provided. The photoresist composition includes materials immiscible with resist resin. The photoresist composition includes Si substitution, fluorine substitution, hyperbranched polymer, and/or polymer particles. The photoresist composition includes resin, photoactive component, and particle materials immiscible with resin. The photoresist composition is coated on the surface. A photoresist layer is exposed by an irradiation ray which activates the photoresist composition.
申请公布号 KR20110053407(A) 申请公布日期 2011.05.23
申请号 KR20110031584 申请日期 2011.04.06
申请人 ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. 发明人 WANG DEYAN
分类号 H01L21/027;G03F7/00;G03F7/004 主分类号 H01L21/027
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