发明名称 METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS
摘要 Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
申请公布号 US2011116087(A1) 申请公布日期 2011.05.19
申请号 US201113012707 申请日期 2011.01.24
申请人 HISTORX, INC. 发明人 CHRISTIANSEN JASON;PINARD ROBERT;ZERKOWSKI MACIEJ P.;TEDESCHI GREGORY R.
分类号 G01J1/10 主分类号 G01J1/10
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