发明名称 SCATTEROMETRY ALIGNMENT FOR IMPRINT LITHOGRAPHY
摘要 PROBLEM TO BE SOLVED: To provide methods for patterning a substrate by imprint lithography. SOLUTION: An imprint head 3100 is fitted to an imprint head support 3910. An imprint head 3910 is fitted so as to always stay at a fixed position. During use, all movements along an X-Y plane are carried out by a motion stage 3600 for the substrate. A system 3900 also includes a liquid dispensation system which dispenses a curable liquid onto the substrate. The liquid dispensation system is coupled to the imprint head 3100. Imprint lithography is a process in which the liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns formed in the template. Alignment of the template with a previously formed layer on a substrate, in one embodiment, is accomplished by using scatterometry. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011101016(A) 申请公布日期 2011.05.19
申请号 JP20100248314 申请日期 2010.11.05
申请人 MOLECULAR IMPRINTS INC 发明人 WATTS MICHAEL P C;MCMACKIN IAN;SREENIVASAN SIDLGATA V;CHOI BYUNG-JIN;VOISIN RONALD D;SCHUMAKER NORMAN E
分类号 H01L21/027;B29C59/02;B81C99/00;G03F;G03F1/00;G03F7/20 主分类号 H01L21/027
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