| 摘要 |
<p>A high-resolution, large-field scanning inspection system for inspecting extruded ceramic honeycomb structures is disclosed. The system allows for inspecting cells at an endface of a cellular ceramic substrate by capturing, along an optical axis, line images of illuminated cells as a line illumination scans over at least a portion of the plurality of cells. The inspection method includes centering the line illumination on the optical axis to make the line illumination normally incident upon the endface. The inspection method also includes forming from the line images a composite image of the cells, and determining from the composite image at least one parameter of at least one cell.</p> |
