发明名称 APPARATUS AND METHOD FOR MEASURING PROPERTY OF CONTACT HEAT CONDUCTION MATERIAL
摘要 According to at least one embodiment of the present invention, an apparatus and a method for measuring the property of a contact heat conduction material are provided. The method comprises the steps of: calculating a thermal current value flowing into the contact heat conduction material which is positioned between one end of a second heat flux bar and a heat sink coupled with one end of a first heat flux bar; calculating temperature on each of the upper and lower surfaces of the contact heat conduction material by considering the calculated thermal current value; and calculating thermal resistance of the contact heat conduction material by considering the calculated thermal current value and the calculated temperature. Thus, the invention is capable of exactly measuring the thermal resistance of the contact heat conduction material contacted with the heat sink.
申请公布号 WO2011059245(A2) 申请公布日期 2011.05.19
申请号 WO2010KR07960 申请日期 2010.11.11
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY;LEE, SUN KYU;KIM, JUNG KYUN;WATARU, NAKAYAMA 发明人 LEE, SUN KYU;KIM, JUNG KYUN;WATARU, NAKAYAMA
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