| 摘要 |
PROBLEM TO BE SOLVED: To provide a microscope device capable of highly accurately observing the internal structure of an observation sample having a non-linear optical effect. SOLUTION: The microscope device 1 includes: a laser light source 10; a plurality of wavelength converting optical elements 12 and 14 for converting the wavelength of light from the laser light source 10 and emitting it as two or more light beams of different angular frequencies; a condenser lens 32 for condensing light beams of predetermined angular frequencyωgenerated by the secondary non-linear optical effect caused when an observation sample 31 receives the light beams emitted from the wavelength converting optical elements 12 and 14; a spectroscope 34 for extracting a light beam of the predetermined angular frequencyωfrom among light beams generated by the secondary non-linear optical effect; an imaging lens 35 for imaging the light beam extracted by the spectroscope 34; and an optical detector 37 for detecting the intensity of the light beam of the predetermined angular frequencyωimaged by the imaging lens 35. COPYRIGHT: (C)2011,JPO&INPIT |
