发明名称 ADC HAVING INPROVED SAMPLE CLOCK JITTER PERFORMACE
摘要 In conventional analog-to-digital converter (ADC) systems, jitter can be a problem because of delay circuits within the sample signal path. Here, an ADC system is provided with a modified delay locked loop (DLL), namely having a variable delay and a fixed delay. The modification to the delay line of DLL enables the removal of delay circuits from the sample path, improve the overall signal to noise ration (SNR).
申请公布号 US2011115536(A1) 申请公布日期 2011.05.19
申请号 US20100938155 申请日期 2010.11.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 AGARWAL NITIN
分类号 H03L7/06 主分类号 H03L7/06
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