| 摘要 |
<p>Disclosed is a fixture of an object being measured that is capable of being used with a housing that houses the object being measured when measurements are made by applying terahertz waves to the object being measured, the fixture alleviating negative effects resulting from the terahertz waves being refracted by the object being measured. Fixtures (100a, 100b) comprise anchoring surfaces (102a, 102b) with the same shapes as that of end surfaces (1c, 1d) of an object being measured (1) that is measured by electromagnetic waves for measurement being projected at frequencies between 0.01THz-100THz, inclusive. The end surfaces (1c, 1d) are anchored by the anchoring surfaces (102a, 102b). When the index of refraction of the fixtures (100a, 100b) is designated n0 and the index of refraction of the object being measured (1) is designated n1, then n1 - 0.1 = n0 = n1 + 0.1. The fixtures (100a, 100b) do not cover the lateral surface (1e) of the object being measured (1). The fixtures (100a, 100b) rotate about an axis designated by a straight line (A) that is perpendicular to the anchoring surfaces (102a, 102b).</p> |
