发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To decrease a heat damage caused by annealing when the annealing is performed to a back electrode. SOLUTION: A semiconductor device includes: a silicon carbide substrate 10 where a vertical short key diode is formed; an anode electrode 20 that is provided on a front surface of the silicon carbide substrate 10; a cathode electrode 50 that is provided on a back surface of the silicon carbide substrate 10; and a conductive adiabatic region 40 that is provided between the silicon carbide substrate 10 and the cathode electrode 50. The adiabatic region 40 has heat conductivity smaller than that of a semiconductor material of the silicon carbide substrate 10. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011100948(A) |
申请公布日期 |
2011.05.19 |
申请号 |
JP20090256438 |
申请日期 |
2009.11.09 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;DENSO CORP;TOYOTA MOTOR CORP |
发明人 |
WATANABE YUKIHIKO;KATSUNO TAKASHI;SOEJIMA SHIGEMASA;YAMAMOTO TAKEO;ENDO TAKESHI;FUJIWARA HIROKAZU;KONISHI MASAKI |
分类号 |
H01L29/47;H01L29/861;H01L29/872 |
主分类号 |
H01L29/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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