发明名称 |
Semiconductor Devices Including Design for Test Capabilities and Semiconductor Modules and Test Systems Including Such Devices |
摘要 |
A semiconductor device includes a resistor terminal, a reference voltage generator and a detector. The resistor terminal is connected to an external resistor. The reference voltage generator generates at least one reference voltage. The detector generates a detection signal based at least in part on a resistor terminal voltage and the at least one reference voltage. The detection signal indicates a state of an electrical connection to the resistor terminal. The resistor terminal voltage is a voltage at the resistor terminal.
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申请公布号 |
US2011115509(A1) |
申请公布日期 |
2011.05.19 |
申请号 |
US20100915314 |
申请日期 |
2010.10.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM SEOK-IL;LEE HO-SUK;HAN YOU-KEUN;KIM YANG-KI |
分类号 |
G01R31/3187 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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