发明名称 Semiconductor Devices Including Design for Test Capabilities and Semiconductor Modules and Test Systems Including Such Devices
摘要 A semiconductor device includes a resistor terminal, a reference voltage generator and a detector. The resistor terminal is connected to an external resistor. The reference voltage generator generates at least one reference voltage. The detector generates a detection signal based at least in part on a resistor terminal voltage and the at least one reference voltage. The detection signal indicates a state of an electrical connection to the resistor terminal. The resistor terminal voltage is a voltage at the resistor terminal.
申请公布号 US2011115509(A1) 申请公布日期 2011.05.19
申请号 US20100915314 申请日期 2010.10.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SEOK-IL;LEE HO-SUK;HAN YOU-KEUN;KIM YANG-KI
分类号 G01R31/3187 主分类号 G01R31/3187
代理机构 代理人
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