发明名称 |
POLYMER FOR UNDER-LAYER OF RESIST, POLYMER COMPOSITION, UNDER-LAYER COMPOSITION OF RESIST, OF PATTERNING DEVICE USING SAME |
摘要 |
<p>PURPOSE: A polymer for a resist underlayer, a resist underlayer composition including the same, and a method for forming patterns are provided to minimize the reflectivity between a resist and an underlayer by securing the adequate refractivity and absorbency of the polymer. CONSTITUTION: A polymer for a resist underlayer includes a repeating unit represented by chemical formula 1 and/or chemical formula 2. A resist underlayer composition includes the polymer and an organic solvent. A method for forming patterns includes the following: A material layer is arranged on a substrate. The resist underlayer is formed on the material layer. A resist layer is formed on the resist underlayer. The substrate is exposed. A developing operation and an etching operation are followed.</p> |
申请公布号 |
KR20110053136(A) |
申请公布日期 |
2011.05.19 |
申请号 |
KR20090109971 |
申请日期 |
2009.11.13 |
申请人 |
CHEIL INDUSTRIES INC. |
发明人 |
SONG, JEE YUN;CHEON, HWAN SUNG;CHO, SUNG WOOK;YOON, KYONG HO;KIM, MIN SOO;OH, SEUNG BAE |
分类号 |
G03F7/11 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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