发明名称 POLYMER FOR UNDER-LAYER OF RESIST, POLYMER COMPOSITION, UNDER-LAYER COMPOSITION OF RESIST, OF PATTERNING DEVICE USING SAME
摘要 <p>PURPOSE: A polymer for a resist underlayer, a resist underlayer composition including the same, and a method for forming patterns are provided to minimize the reflectivity between a resist and an underlayer by securing the adequate refractivity and absorbency of the polymer. CONSTITUTION: A polymer for a resist underlayer includes a repeating unit represented by chemical formula 1 and/or chemical formula 2. A resist underlayer composition includes the polymer and an organic solvent. A method for forming patterns includes the following: A material layer is arranged on a substrate. The resist underlayer is formed on the material layer. A resist layer is formed on the resist underlayer. The substrate is exposed. A developing operation and an etching operation are followed.</p>
申请公布号 KR20110053136(A) 申请公布日期 2011.05.19
申请号 KR20090109971 申请日期 2009.11.13
申请人 CHEIL INDUSTRIES INC. 发明人 SONG, JEE YUN;CHEON, HWAN SUNG;CHO, SUNG WOOK;YOON, KYONG HO;KIM, MIN SOO;OH, SEUNG BAE
分类号 G03F7/11 主分类号 G03F7/11
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