发明名称 PROBE PIN
摘要 <p>Disclosed is a probe pin, the useful life whereof is extended, the electrical resistance whereof reduced, and the stability whereof improved. The probe pin (100) comprises a barrel (110) whereupon an interior space that passes from one end to the other end is formed, a plunger (120) that is attached upon one end of the barrel, a plunger (130) that is attached upon the other end of the barrel, and a coil spring (140) that is housed within the barrel and elastically supports the plungers (120, 130). The coil spring further comprises a central component (142) with an approximately consistent diameter thereupon, a first taper component (144) that adjoins one side of the central component (142), and has a diameter that gradually shrinks, and a second taper component (146) that adjoins the other side of the central component (142), and has a diameter that gradually shrinks, wherein the central axes (C1, C2) of the first and second taper components intersect the central axis (C) of the central component (142).</p>
申请公布号 WO2011058646(A1) 申请公布日期 2011.05.19
申请号 WO2009JP69343 申请日期 2009.11.13
申请人 TEST TOOLING SOLUTIONS GROUP PTE., LTD.;OISHI YOSHITAKA 发明人 OISHI YOSHITAKA
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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